Skip to main content
Log in
Log in
Toggle navigation menu
Open settings menu
Open search
Advanced Search
Main navigation
Home
Content
Ahead of Print
Current Issue
Special Issues
All Issues
Contribute
Submit to AUF
Author Guidelines
Reviewer Guidelines
About
Overview
Editorial Board
Journal Metrics
International Society of Arboriculture
More
Contact
Feedback
Alerts
Advanced Search
Log in
Log in
x-ray-tomography
Using High-Technology Instruments to Assess Defects in Trees
Giovanni Nicolotti
and Paolo Miglietta
Arboriculture & Urban Forestry (AUF) November 1998, 24 (6) 297-302;
DOI:
https://doi.org/10.48044/jauf.1998.037
